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IP Testing Equipment
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IEC 60529 IP Testing Equipment IP Test Probe Kit Jointed Test Finger And Test Rod

IEC 60529 IP Testing Equipment IP Test Probe Kit Jointed Test Finger And Test Rod

Brand Name: HongCe
Model Number: HT-I01-I06
MOQ: 1 set
Price: Negotiatable
Payment Terms: T/T
Supply Ability: 20 set per month
Detail Information
Place of Origin:
China
Certification:
calibration certificate(cost additional)
Standard:
IEC 60529
Product Name:
IP Test Probe Kit
Application:
Access Probes
IP1X:
Sphere 50 Mm Diameter
IP2X:
Jointed Test Finger And Sphere 12.5 Mm
IP3X:
Test Rod 2,5 Mm Diameter, 1 00 Mm Long
IP4X:
Test Wire 1 ,0 Mm Diameter, 1 00 Mm Long
Required Test Force:
50N, 30N, 10N, 3N AND 1N
Packaging Details:
Carton box
Highlight:

Ingress Protection Testing Equipment

,

Jointed Test Finger IP Testing Equipment

Product Description

IP Testing Equipment IP Test Probe Kit Jointed Test Finger and Test Rod

 

Application of IP Testing Equipment:

IP Test Probe Kit is a set of tools used to determine the degrees of protection provided by product enclosure against access to hazardous parts and ingress of solid foreign objects. It consists of access probes and object probes, which are required to be pushed against or inserted through any openings of the enclosure with the specified forces during testing. The access probes are used to simulate in a conventional manner a part of a person or a tool held by an operator to confirm whether there is sufficient clearance from hazardous parts. The object probes are applied to simulate solid foreign objects to confirm the possibility of ingress into an enclosure.

 

Feature of IP Testing Equipment:

IP test probes are made of insulating nylon material and stainless steel.

Each of the test probes is equipped with a wire and an alligator clip to connect to the hazardous parts inside the enclosure conveniently when testing on low-voltage equipment.

Included IP1X/2X/3X/4X Test Probes.

Item Parameter Standard figure
IP1X test probe - 50.0 diameter sphere

Sphere diameter: 50 mm

Guard diameter: 45 mm & guard thickness: 4 mm

Handle length: 100 mm & handle diameter: 10 mm

Required test force: 50 N ± 10 %

IEC 60529 IP Testing Equipment IP Test Probe Kit Jointed Test Finger And  Test Rod 0
IP2X access probe - Jointed test finger

Finger length: 80 mm and utmost diameter: 12 mm

The finger consists of 2 joints able to be bent over an angle of up to 90°

Stop face: 50 mm in diameter x 20 mm

Required test force: 10 N ± 10 %

IEC 60529 IP Testing Equipment IP Test Probe Kit Jointed Test Finger And  Test Rod 1
IP2X object probe - 12.5 mm diameter sphere

Sphere diameter: 12.5 mm

Guard diameter: 10 mm & guard thickness: 4 mm

Handle length: 100 mm & handle diameter: 4 mm

Required test force: 30 N ± 10 %

IEC 60529 IP Testing Equipment IP Test Probe Kit Jointed Test Finger And  Test Rod 2
IP3X test probe - Test rod

Rigid test rod length: 100 mm & rod diameter: 2.5 mm

Stop face: 35 mm diameter sphere

Handle length: 100 mm & handle diameter: 10 mm

Required test force: 3 N ± 10 %

IEC 60529 IP Testing Equipment IP Test Probe Kit Jointed Test Finger And  Test Rod 3
IP4X test probe - Test wire

Rigid test wire length: 100 mm & wire diameter: 1.0 mm

Stop face: 35 mm diameter sphere

Handle length: 100 mm & handle diameter: 10 mm

Required test force: 1 N ± 10 %

IEC 60529 IP Testing Equipment IP Test Probe Kit Jointed Test Finger And  Test Rod 4