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IEC62151 Figure 3 Test Probe Length 80mm Diameter 12mm For Information Technology Equipment

IEC62151 Figure 3 Test Probe Length 80mm Diameter 12mm For Information Technology Equipment

  • IEC62151 Figure 3 Test Probe Length 80mm Diameter 12mm For Information Technology Equipment
  • IEC62151 Figure 3 Test Probe Length 80mm Diameter 12mm For Information Technology Equipment
  • IEC62151 Figure 3 Test Probe Length 80mm Diameter 12mm For Information Technology Equipment
IEC62151 Figure 3 Test Probe Length 80mm Diameter 12mm For Information Technology Equipment
Product Details:
Place of Origin: China
Brand Name: HongCe
Certification: Third part calibration certificate(cost additional)
Model Number: HT-I23
Payment & Shipping Terms:
Minimum Order Quantity: 1 set
Price: Negotiatable
Packaging Details: Aluminum Box
Delivery Time: 3 Days
Payment Terms: T/T
Supply Ability: 100 set/ month
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Detailed Product Description
Name: Test Probe Model: HT-I23
Standards: IEC60065, IEC62151, UL6500 Warranty: 1 Year
Lead Time: Within Very Short Time Probe Length: 80mm
Baffle Plate Diameter: 50mm Material: Nylon Handle + Stainless Steel Probe
High Light:

Figure 3 Test Probe

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IEC 62151 Test Probe

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Length 80mm Test Probe

IEC62151 Figure 3 - Test Probe - Length 80mm Diameter 12mm - For Information Technology Equipment

 

IEC62151 clause 4.2.2.1 Accessibility
The equipment shall be so constructed that in USER ACCESS AREAS there is adequate protection against contact with bare parts of TNV - 1 , TNV - 2 and
TNV - 3 CIRCUITS except that access is permitted to:                  Test Finger Probe
– contacts of connectors which cannot be touched by the test probe (figure 3);
– bare conductive parts in the interior of a battery compartment that complies with 4.2.2.2;
– bare conductive parts of TNV - 1 CIRCUITS that are connected to a PROTECTIVE EARTHING terminal;
– bare conductive parts of TNV - 1 CIRCUIT connectors that are separated from unearthed ACCESSIBLE conductive parts of the equipment in accordance with 4.2.1 .2;                                 Test Finger Probe

Compliance is checked by inspection, by measurement and by means of the test finger (IEC 61032, test probe B) applied as specified in the compliance section of the relevant equipment standard), and the test probe, figure 3.

 

Standard:Conforms to IEC60065: 2014 Annex B, IEC62151 figure 3 and UL6500 figure B.1.

Application:It is used for the bare parts of TNV circuits of information technology equipment to see whether they have sufficient protection.

Test sample:Information technology equipment.

Feature:Nylon handle + stainless steel probe.                                                                                   Test Finger Probe

Parameters:

Model HT-I23
Probe length 80                      Test Finger Probe
End radius R6
Probe diameter Φ12
Baffle diameter of the handle 50
 

IEC62151 Figure 3 Test Probe Length 80mm Diameter 12mm For Information Technology Equipment 0

 

Contact Details
Guangzhou HongCe Equipment Co., Ltd.

Contact Person: Tessa Huang

Tel: +8618933919125

Fax: 86-020-31143909-805

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