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IEC60529-1 Test Finger Probe Test Finger Probe B With Force Of 10N , 20N , 30N

Brand Name:	HongCe
Model Number:	HT-I02T
MOQ:	1 set
Price:	Negotiatable
Payment Terms:	T/T
Supply Ability:	30 sets per month

Detail Information

Product Description

Detail Information

Place of Origin:

China

Certification:

Calibration certificate(cost additional)

Product Name:

Test Finger Probe B

Material:

Plastic + Stainless Steel

Color:

White

Usage:

IEC Test Equipment

Warranty:

1 Year

Lead Time:

Within Very Short Time

Standards:

IEC60529-1

Force:

10N, 20N, 30N

Packaging Details:

Aluminum box

Highlight:

IEC 60529-1 Test Finger Probe

30N Test Finger Probe

10N Test Finger Probe

Product Description

IEC60529-1 Test Finger Probe Test Finger Probe B With Force Of 10N , 20N , 30N

Standard: IEC 61032 figure 2, IEC60950 figure 2A, IEC60884, IEC60335, UL507, and UL1278 figure 8.4.

Application: This probe is intended to verify the basic protection against access to hazardous parts. It is also used to verify the protection against access with a finger.

Test sample: Easily accessible enclosure live parts or mechanical parts.

Feature: This test finger probe consists of dito, finger, base and insulated handle which simulates the characteristics of the human hand. It has two movable joints, which can be curved at 90°. Customizable: it can be used for anti-electric shock test when equipped with pluggable banana plugs and amphenol connector at the end of the handle , or used for enclosure protection test when open threaded hole of M6 at the end of the handle (connected with pull and push dynamometer).

Parameters(mm):

Model	HT-I02	HT-I02A	HT-I02B	HT-I02T
Name	Standard Test Finger	Circular Baffle Test finger	Large Baffle Test Finger	Standard Test Finger With Force
Joint 1	30±0.2	30±0.2	30±0.2	30±0.2
Joint 2	60±0.2	60±0.2	60±0.2	60±0.2
Finger length	80±0.2	80±0.2	100±0.2	80±0.2
Fingertip to baffle	180±0.2	180±0.2	----	180±0.2
Cylindrical	R2±0.05	R2±0.05	R2±0.05	R2±0.05
Spherical	R4±0.05	R4±0.05	R4±0.05	R4±0.05
Fingertip cutting bevel angle	37^o 0 -10′	37^o 0 -10′	37^o 0 -10′	37^o 0 -10′
Fingertip taper	14^o 0 -10′	14^o 0 -10′	14^o 0 -10′	14^o 0 -10′
Test finger diameter	Ф12 0 -0.05	Ф12 0 -0.05	Ф12 0 -0.05	Ф12 0 -0.05
A-A Section diameter	Ф50	Ф50	----	Ф50
A-A Section width	20±0.2	----	----	20±0.2
Baffle diameter	Ф75±0.2	Ф75±0.2	Ф125±0.2	Ф75±0.2
Baffle thickness	5±0.5	5±0.5	----	5±0.5
Force	----	----	----	With force of 10N, 20N,30N
Applied standard	IEC61032-1	IEC60335-1	IEC60335-2-14	IEC60529-1

IEC60529-1 Test Finger Probe Test Finger Probe B With Force Of 10N , 20N , 30N 0

IEC60529-1 Test Finger Probe Test Finger Probe B With Force Of 10N , 20N , 30N 1

Tags:

HT-I23 Telecom Test Probe IP Protection Level Testing Equipment IEC 60529 Certification Industrial Grade Safety Testing Solutions

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products details

IEC60529-1 Test Finger Probe Test Finger Probe B With Force Of 10N , 20N , 30N

IEC60529-1 Test Finger Probe Test Finger Probe B With Force Of 10N , 20N , 30N

IEC 60529-1 Test Finger Probe

30N Test Finger Probe

10N Test Finger Probe