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| Place of Origin: | China |
| Brand Name: | HongCe |
| Certification: | Third part calibration certificate(cost additional) |
| Model Number: | HT-U14 |
| Minimum Order Quantity: | 1 set |
|---|---|
| Price: | Negotiatable |
| Packaging Details: | Aluminum Box |
| Delivery Time: | 3 Days |
| Payment Terms: | T/T |
| Supply Ability: | 100 sets/ month |
| Product Name: | UL Wedge Probe | Warranty: | 1 Year |
|---|---|---|---|
| Lead Time: | Within Very Short Time | Standards: | IEC 62368-1, UL60950 And Etc. |
| Material: | Nylon Handle + Stainless Steel Probe | Application: | Hazardous Parts Of Shredder |
| Usage: | Safeguards Against Moving Parts Testing | Distance From Probe Tip Of 180mm: | 24mm |
| High Light: | Figure V4 Test Finger Probe,Document Shredders Test Finger Probe |
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IEC 62368-1 Figure V4 Test Finger Probe Wedge Probe For Testing Document Shredders
Standard description(IEC 62368-1 8.5.4.2.4): The media destruction device is tested with the wedge probe of Figure V.4 applied in any direction relative to the opening:
− with a force up to 45 N for a strip-cut type device; and
− with a force up to 90 N for a cross-cut type device. Test Finger Probe
NOTE Media destruction devices are typically identified as either strip-cut type or cross-cut type. A strip-cut media destruction device shreds the media into long strips using a motor-based shredding mechanism. A cross-cut media destruction device shreds the media two or more ways into tiny particles, Test Finger Probe
ypically using a more powerful motor and more complex shredding mechanism.
Any enclosure or guard that can be removed or opened by an ordinary person or an instructed person shall be removed or opened prior to application of the probes.
Standard:IEC 62368-1 Figure V.4, UL60950 figure NAF.2 and NAF.3, IEC 60950-1 Fig NAF.2(S5366)and NAF.3(S5370)as well as BS 60950.1108/260/CD and etc. Test Finger Probe
Application:It is used to test whether the hazardous parts of shredder can be touched by people.
Test sample:Paper shredder
Feature:Nylon handle + probe, it is manufactured according to the standard figure.
Parameters:
Tolerances on linear dimensions without specific tolerances:
≤ 25 mm: ± 0,1 3 mm
> 25 mm: ± 0,3 mm
NOTE The thickness of the probe varies linearly, with slope changes at the following points along the probe:
|
Distance from probe tip mm |
Probe thickness mm |
| 0 | 2 |
| 12 | 4 |
| 180 | 24 |
Picture for reference:
Contact Person: Tessa Huang
Tel: +8618933919125
Fax: 86-020-31143909-805
